From a246053511505c2e5289eff3dbe4e88717b0ca50 Mon Sep 17 00:00:00 2001 From: Ronald Tse Date: Mon, 4 May 2026 15:08:28 +0800 Subject: [PATCH] Expand team page with contributors from training materials and reference documents MIME-Version: 1.0 Content-Type: text/plain; charset=UTF-8 Content-Transfer-Encoding: 8bit Add detailed subsections for 8 key contributors with equal treatment: - Thomas Thurman (Project Leader) — existing detail preserved - Allison Barnard Feeney (NIST) — PMI models, standards methodology - Kevin Brady (NIST) — strategic direction, concept of operations - Michael Keenan (NIST) — JSDAI reference implementation - Peter Denno (NIST) — systems engineering, PLM requirements - Jamie Stori (SFM Technology) — concept of operations, thermal models - John Mettenburg (Rockwell Collins) — MBSE - Dwayne Hardy (American Systems) — MBSE Add Additional Contributors section with 7 test case authors. Add Reference Publications section citing 10 NIST documents with URLs. --- content/pages/about-team.adoc | 139 ++++++++++++++++++++++++++++++++-- 1 file changed, 134 insertions(+), 5 deletions(-) diff --git a/content/pages/about-team.adoc b/content/pages/about-team.adoc index 90801eb5..4d934ef9 100644 --- a/content/pages/about-team.adoc +++ b/content/pages/about-team.adoc @@ -12,7 +12,7 @@ AP 210 is developed and maintained under *ISO Technical Committee 184, Subcommit == Key Contributors -The following individuals have made significant contributions to AP 210 development and its supporting research: +The following individuals have made significant contributions to AP 210 development, research, and its supporting ecosystem. === Thomas Thurman — AP 210 Project Leader @@ -41,11 +41,140 @@ The following individuals have made significant contributions to AP 210 developm * Coordinated AP 210 development across PDES Inc., NIST, Boeing, Rockwell Collins, and the ISO TC 184/SC 4 community * Chaired the AP 210 design rule formalism discussions with Gregory Smith (Boeing) and Manas Bajaj (Georgia Tech) -=== Other Key Contributors +*Selected publications:* Co-author of <>, <>, <>, <>, and <>. -* *Allison Barnard Feeney* — NIST research leadership and standards methodology -* *Michael Keenan* — NIST research engineering and implementation -* *Kevin Brady* — NIST strategic direction for STEP standards +=== Allison Barnard Feeney — NIST Research Leader + +*Allison Barnard Feeney* is a *Computer Scientist at NIST* who provided research leadership and standards methodology for AP 210 and the broader STEP program. + +*Standards research:* + +* Led NIST research on product manufacturing information (PMI) representation in STEP standards +* Co-authored <> on migrating ISO 10303 PMI models to a common core +* Advanced standards methodology for interoperability of product data across the STEP application protocol family + +*Standards development:* + +* Contributed to the development and validation of multiple STEP application protocols +* Participated in ISO TC 184/SC 4 standards development activities +* Guided NIST research partnerships with PDES Inc. and industry + +=== Kevin Brady — NIST Strategic Direction + +*Kevin Brady* provided *strategic direction for STEP standards* at NIST, guiding the long-term vision for industrial data interoperability. + +*Research leadership:* + +* Co-authored <> (AP210 Edition 2 Concept of Operations) with Jamie Stori, defining the operational framework for the standard +* Co-authored <> on the representation of thermal resistor network models for packaged components in STEP AP210 Edition 2 +* Directed NIST programs supporting STEP implementation and validation across industry + +*Strategic impact:* + +* Shaped NIST strategy for standards-based engineering data exchange +* Fostered collaboration between NIST, PDES Inc., and defense industry partners + +=== Michael Keenan — NIST Research Engineering + +*Michael Keenan* contributed *research engineering and implementation* for AP 210 at NIST. + +*Implementation work:* + +* Developed the NIST JSDAI reference implementation for AP210, including the MIMqueries interface and model traversal APIs +* Built validation tools and test infrastructure used to verify AP210 conformance +* Contributed to test case development for the PDES Test Cases Project + +*Engineering contributions:* + +* Supported the integration of AP210 data with design and analysis tools +* Participated in interoperability testing across multiple vendor implementations + +=== Peter Denno — NIST Systems Engineering and Information Modeling + +*Peter Denno* is a *Computer Scientist at NIST* specializing in systems engineering, information modeling, and integration schema. + +*Research contributions:* + +* Co-authored <> on requirements for information technology supporting product lifecycle management, analyzing cohesion and traceability in engineering data +* Co-authored <> on enabling model-based systems engineering disciplines, connecting AP210 with MBSE methodology +* Developed process-aware integration schema concepts that advanced the theoretical foundation for AP210 as an integration standard + +*Standards and tools:* + +* Contributed to the EXPRESS-X mapping language development (ISO 10303-14) +* Advanced AP233 (systems engineering) and SysML integration with STEP data +* Developed model-driven integration techniques for existing engineering models + +=== Jamie Stori — Concept of Operations + +*Jamie Stori* of *SFM Technology, Inc.* defined the conceptual framework for AP210 Edition 2. + +*Standards development:* + +* Authored <> (AP210 Edition 2 Concept of Operations), the foundational document describing how AP210 addresses electronic assembly design data exchange +* Co-authored <> on the representation of thermal resistor network models for packaged components in STEP AP210 + +*Analytical work:* + +* Developed thermal management models for electronic components using STEP AP210 data structures +* Contributed to the analysis of how AP210 could represent thermal and physical characteristics of packaged electronic components + +=== John Mettenburg — Rockwell Collins Systems Engineering + +*John Mettenburg* is a *Principal Systems Engineer at Rockwell Collins* (now Collins Aerospace) who contributed to model-based systems engineering for AP210. + +*Research contributions:* + +* Co-authored <> on enabling model-based systems engineering disciplines, demonstrating how AP210 data supports systems engineering workflows +* Advanced the application of AP210 in the context of defense and aerospace systems engineering + +*Industry application:* + +* Bridged AP210 data standards with model-based systems engineering practices at Rockwell Collins +* Contributed to the practical validation of AP210 concepts in real-world engineering environments + +=== Dwayne Hardy — American Systems + +*Dwayne Hardy* of *American Systems* contributed to the systems engineering research that connected AP210 with broader MBSE methodology. + +*Research contributions:* + +* Co-authored <> on enabling model-based systems engineering disciplines +* Contributed to the analysis of how STEP standards, including AP210, support systems engineering data integration + +== Additional Contributors + +The following individuals contributed to AP 210 through test case development, training materials, implementation work, and standards discussions within the PDES and NIST programs: + +* *James F. Adams* (The Boeing Company) — author of PDES test cases including PDES-181 (Complex Multi-layer PCA) +* *Steve Waterbury* (NASA) — test case author and contributor to product lifecycle management research at NIST +* *Mike Benda* — co-contributor on recommended practices for AP210 +* *Jim Evans* — PDES test case author +* *Kevin Cline* — PDES test case author +* *Craig Lanning* — PDES test case author +* *Paul Monson* — PDES test case author + +== Reference Publications + +[[ref-nist-ams-100-51]] . *NIST AMS 100-51:* _On Migrating ISO 10303 PMI Models to a Common Core_ — Allison Barnard Feeney and Thomas Thurman. https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=935394[Available from NIST^]. + +[[ref-nist-ams-300-12]] . *NIST AMS 300-12:* _Research Results and Recommendations for Universally Unique Identifiers_ — NIST. https://nvlpubs.nist.gov/nistpubs/ams/NIST.AMS.300-12.pdf[Available from NIST^]. + +[[ref-nist-gcr-15-990]] . *NIST GCR 15-990:* _Representation of Thermal Resistor Network Model for Packaged Component in STEP AP210 Edition 2_ — Jamie Stori, Kevin Brady, and Thomas Thurman. https://www.nist.gov/publications/representation-thermal-resistor-network-model-packaged-component-step-ap210-edition-2[Available from NIST^]. + +[[ref-nist-gcr-15-991]] . *NIST GCR 15-991:* _Extensions of Recommended Practices for GD&T in STEP-AP210 in the Context of Packaged Electronic Components_ — NIST. https://www.nist.gov/publications/extensions-recommended-practices-gdt-step-ap210-context-packaged-electronic-components[Available from NIST^]. + +[[ref-nistir-6991]] . *NIST IR 6991:* _Representation of Thermal Resistor Network Model for a Packaged Component for Use in STEP AP210_ — NIST. https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=903903[Available from NIST^]. + +[[ref-nistir-7648]] . *NIST IR 7648:* _NISTIR 7648_ — NIST. https://doi.org/10.6028/NIST.IR.7648[Available from NIST^]. + +[[ref-plm-denno]] . _Requirements on Information Technology for Product Lifecycle Management_ — Peter Denno (NIST) and Thomas Thurman (Rockwell Collins). https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=822191[Available from NIST^]. + +[[ref-incose-denno]] . _On Enabling a Model-Based Systems Engineering Discipline_ — Peter Denno (NIST), Thomas Thurman (Rockwell Collins), John Mettenburg (Rockwell Collins), and Dwayne Hardy (American Systems). https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=824653[Available from NIST^]. + +[[ref-nistir-7677]] . *NIST IR 7677:* _AP210 Edition 2 Concept of Operations_ — Jamie Stori (SFM Technology) and Kevin Brady (NIST). https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905123[Available from NIST^]. + +[[ref-nistir-7717]] . *NIST IR 7717:* _Use Cases for the Management and Maintenance of Multi-Domain AP 210 Component Models_ — NIST. https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=906355[Available from NIST^]. == NIST